HOME
MODEL 2010/ M OVERVIEW
APPLICATIONS
Applications Overview
Optical Waveguide Characterization
Waveguide Loss Measurement
Bulk Material or Thick Film Index/Birefringence Measurement
Index vs Temperature Option (dn/dT)
Measuring Effect of Nanomaterials/Dopants and Process Variables on Index
Measuring Index of Liquids Inside Sealed Containers
Mesuring Index and Thickness of Silicon Films/Waveguides
Measuring Index of Contact and Intraocular Lenses While Submerged in Hydrating Fluid
Spectroscopic Measurements of Index vs Wavelength (Dispersion)
Characterization of SPR and Waveguide Structures for Sensor Applications
High Accuracy Measurement of Resist, Polyimide, and Polymer Thin Films
Measuring Index/Birefringence of Bulk Polymers and Flexible Polymer Films
Dual Film Measurements
Monitoring of Phosphorus and Other Dopant Concentrations in Silicon Dioxide
ELLIPSOMETRY COMPARISON
JOURNAL REFERENCES
SPECIFICATIONS
ORDERING GUIDE
CONTACT
Request for Information
Sales Reps
HOME
MODEL 2010/ M OVERVIEW
APPLICATIONS
Applications Overview
Optical Waveguide Characterization
Waveguide Loss Measurement
Bulk Material or Thick Film Index/Birefringence Measurement
Index vs Temperature Option (dn/dT)
Measuring Effect of Nanomaterials/Dopants and Process Variables on Index
Measuring Index of Liquids Inside Sealed Containers
Mesuring Index and Thickness of Silicon Films/Waveguides
Measuring Index of Contact and Intraocular Lenses While Submerged in Hydrating Fluid
Spectroscopic Measurements of Index vs Wavelength (Dispersion)
Characterization of SPR and Waveguide Structures for Sensor Applications
High Accuracy Measurement of Resist, Polyimide, and Polymer Thin Films
Measuring Index/Birefringence of Bulk Polymers and Flexible Polymer Films
Dual Film Measurements
Monitoring of Phosphorus and Other Dopant Concentrations in Silicon Dioxide
ELLIPSOMETRY COMPARISON
JOURNAL REFERENCES
SPECIFICATIONS
ORDERING GUIDE
CONTACT
Request for Information
Sales Reps
Measuring Dispersion and Birefringence in Bulk Materials
